J. Safra Sarasin Holding AG Sells 53,461 Shares of Onto Innovation Inc. (NYSE:ONTO)

J. Safra Sarasin Holding AG decreased its stake in shares of Onto Innovation Inc. (NYSE:ONTO - Free Report) by 34.8% during the 4th quarter, according to the company in its most recent filing with the Securities and Exchange Commission (SEC). The firm owned 100,111 shares of the semiconductor company's stock after selling 53,461 shares during the quarter. J. Safra Sarasin Holding AG owned approximately 0.20% of Onto Innovation worth $16,686,000 as of its most recent SEC filing.

A number of other institutional investors and hedge funds have also recently modified their holdings of the company. Kestra Investment Management LLC acquired a new position in shares of Onto Innovation during the fourth quarter worth about $26,000. Mather Group LLC. boosted its stake in shares of Onto Innovation by 209.4% during the 4th quarter. Mather Group LLC. now owns 164 shares of the semiconductor company's stock worth $27,000 after purchasing an additional 111 shares during the last quarter. Versant Capital Management Inc grew its stake in Onto Innovation by 532.4% in the 4th quarter. Versant Capital Management Inc now owns 234 shares of the semiconductor company's stock worth $39,000 after acquiring an additional 197 shares during the period. SBI Securities Co. Ltd. acquired a new stake in Onto Innovation in the 4th quarter worth about $43,000. Finally, Aster Capital Management DIFC Ltd purchased a new stake in Onto Innovation in the fourth quarter valued at approximately $47,000. Institutional investors and hedge funds own 98.35% of the company's stock.

Onto Innovation Stock Performance

Shares of ONTO stock traded up $5.20 on Thursday, hitting $125.19. The company had a trading volume of 914,160 shares, compared to its average volume of 798,801. Onto Innovation Inc. has a twelve month low of $98.21 and a twelve month high of $238.93. The stock's 50-day moving average is $132.46 and its two-hundred day moving average is $167.44. The firm has a market cap of $6.11 billion, a P/E ratio of 30.83, a P/E/G ratio of 0.89 and a beta of 1.46.

Onto Innovation (NYSE:ONTO - Get Free Report) last released its quarterly earnings results on Thursday, February 6th. The semiconductor company reported $1.51 earnings per share for the quarter, beating analysts' consensus estimates of $1.41 by $0.10. Onto Innovation had a net margin of 20.43% and a return on equity of 14.24%. Equities research analysts predict that Onto Innovation Inc. will post 6.26 EPS for the current year.

Wall Street Analysts Forecast Growth

ONTO has been the topic of several recent research reports. Cantor Fitzgerald restated an "overweight" rating and set a $250.00 target price on shares of Onto Innovation in a report on Friday, February 7th. Oppenheimer decreased their target price on Onto Innovation from $240.00 to $150.00 and set an "outperform" rating for the company in a research note on Friday, April 11th. Stifel Nicolaus cut their price objective on shares of Onto Innovation from $200.00 to $180.00 and set a "buy" rating on the stock in a research report on Tuesday, April 15th. Jefferies Financial Group lowered their price target on Onto Innovation from $245.00 to $175.00 and set a "buy" rating on the stock in a report on Friday, March 28th. Finally, Needham & Company LLC reaffirmed a "buy" rating and issued a $230.00 price objective on shares of Onto Innovation in a research note on Friday, February 7th. One analyst has rated the stock with a hold rating and eight have given a buy rating to the company. According to data from MarketBeat.com, Onto Innovation presently has an average rating of "Moderate Buy" and an average price target of $218.13.

Onto Innovation Company Profile

Onto Innovation Inc engages in the design, development, manufacture, and support of process control tools that performs optical metrology. The company offers lithography systems and process control analytical software. It also offers process and yield management solutions, and device packaging and test facilities through standalone systems for optical metrology, macro-defect inspection, packaging lithography, and transparent and opaque thin film measurements.